Advanced Computer Vision and AI Techniques for Nano-Scale Quality Control in Aerospace Manufacturing

Authors

  • Gihyun Kim Cheongna Dalton School

DOI:

https://doi.org/10.47611/jsrhs.v13i1.6180

Keywords:

artificial intelligence, manufacturing, aerospace, computer vision

Abstract

This paper examines the integration of advanced computer vision (CV) techniques and Artificial Intelligence (AI) algorithms to improve quality control (QC) for nano-scale manufacturing processes in the space industry. As nanotechnology is regularly used in the space industry for manufacturing electromechanical components such as NEMS (Nanoelectromechanical Systems), solar panels, and energy storage devices, it's becoming increasingly important to detect defects or imperfections in one of those systems to prevent the loss of life and a costly catastrophe. In order to help mediate this issue, this paper will discuss the methods and processes that can be implemented to capture and analyze nano-scale images and data in order to detect possible flaws in the components. 

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References or Bibliography

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Published

02-29-2024

How to Cite

Kim, G. (2024). Advanced Computer Vision and AI Techniques for Nano-Scale Quality Control in Aerospace Manufacturing. Journal of Student Research, 13(1). https://doi.org/10.47611/jsrhs.v13i1.6180

Issue

Section

HS Review Articles